System specifications

ForceRobot® 300 is available in 2 configurations for sample positioning or mapping utilizing the same head

1. ForceRobot® 300 MotorizedStage
   • Travel range of 2 × 2cm²
   • Step Size (Resolution) better than 1 μm
   • Repeatability better than 1 μm
2. ForceRobot® 300 PrecisionMappingStage
   • Travel range of 100 × 100 μm² under closed loop control
   • Position noise better than 0.3 nm closed loop

Both configurations can be used with inverted research microscopes or as stand-alone systems and work with JPK‘s DirectOverlay™ feature.

ForceRobot® 300 can be operated:

1. On top of an inverted research microscope for Single Molecule Force Spectroscopy (SMFS) simultaneously with Fluorescence Microscopy
   • Find a measurement spot optically on your sample by fluorescent labelling
   • Combine SMFS with advanced optical techniques such as FCS, FRET, TIRF or optical tweezers
   • Exact positioning and overlay of optical and force spectroscopy data with the JPK DirectOverlay™ software module
   • Fits to microscope based from
     • Zeiss (Axio Observer, AxioVert 200)
     • Olympus (IX line)
     • Nikon (TE 2000, Ti)
     • Leica (DMI line)
2. Stand-alone system
   • Maximum flexibility even if no fluorescence is needed (only 1 minute to mount the stage on an optical microscope)
   • Free access to the sample area

Highest data quality and output

• 200,000 curves per 24 hours in unattended mode while varying parameters such as temperature or loading rate
• Highest data density with virtually unlimited points per force curve

Automate your measurements

• Intelligent and automated approach for soft landing even with functionalized tips
• User-friendly automated laser and detector alignment eliminates cantilever drift for long term measurements
• Automated sample positioning or mapping with high precision sample stages
• Full remote instrument operation through internet

ForceRobot® 300 head

• Rigid low-noise construction and drift-minimized mechanics based on our proven NanoWizard® design
• Liquid-safe concept with integrated vapour barrier, special encapsulated piezo drives and tip moving design
• Intelligent and automated approach with user defined parameters for different experiments
• Automated laser and detector alignment for long term experiments
• IR detection light source with low coherence
• High detector bandwidth of 8 MHz for high speed signal capture
• 980 nm wavelength detection light source for undisturbed fluorescence or Raman experiments
• Built-in optical filters for fluorescence without crosstalk with the beam deflection detection
• Built-in CCD camera for viewing the probe and sample
• High-speed flexure stage with ultrafast z-response and closed loop control
• Piezo options:
  • 6.5 μm z-range with fast response
  • 15 μm z-range for long pulling ranges (optional)
• Z-sensor noise level: 0.06 nm RMS at 0.1-1 kHz bandwidth
• Laser safety class 1

Control electronics

• 4 high speed 16 bit ADCs with 60 MHz
• High-speed data capture with optional burst mode
• Modular analog and digital design with latest PPC technology (PowerPC @ 660 MHz)
• Discrete analog high-speed high voltage amplifiers
• Gigabit Ethernet interface for fast data link
• Number of data points that can be captured continuously: restricted only by HDD
• Thermal noise acquisition up to 3.25 MHz
• connectors for maximum experimental freedom

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SPMControl software

• Fully automated data acquisition
• Highest density of data points per force curve
• Fully automated sensitivity and spring constant calibration
• Automated re-calibration and cantilever drift compensation
• JPK ExperimentPlanner™ for designing a dedicated measurement workflow
• JPK RampDesigner™ for custom designed force curve segments
• Advanced spectroscopy modes such as
  • Various force clamp modes
  • User-defined temperature ramps, pulling speed or force feedback
• Enhanced force mapping capabilities
• Automated online and offline advanced filtering of curves, based on multiple criteria e.g. force, length and loading rate ranges
• Powerful batch processing including WLC, FJC, step fitting and other analysis
• JPK‘s DirectOverlay™ feature as an option
• Molecular recognition mapping

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Integrated flexibility from the widest range of accessories in the market

• Sample stages for all major inverted optical microscope manufactures such as Zeiss, Nikon, Olympus and Leica
• JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions
• Fluid cells and temperature control options for measurements from -120°C up to 300°C
• JPK‘s ForceWheel accessory for most sensitive experiment control
• Vibration and acoustic isolation from leading suppliers

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