System specifications

ForceRobot® 300 is available in 2 configurations for sample positioning or mapping utilizing the same head

  1. ForceRobot® 300 MotorizedStage
    • Travel range of 2 × 2cm²
    • Step Size (Resolution) better than 1 μm
    • Repeatability better than 1 μm
  2. ForceRobot® 300 PrecisionMappingStage
    • Travel range of 100 × 100 μm² under closed loop control
    • Position noise better than 0.3 nm closed loop

Both configurations can be used with inverted research microscopes or as stand-alone systems and work with JPK‘s DirectOverlay™ feature.

ForceRobot® 300 can be operated:

  1. On top of an inverted research microscope for Single Molecule Force Spectroscopy (SMFS) simultaneously with Fluorescence Microscopy
    • Find a measurement spot optically on your sample by fluorescent labelling
    • Combine SMFS with advanced optical techniques such as FCS, FRET, TIRF or optical tweezers
    • Exact positioning and overlay of optical and force spectroscopy data with the JPK DirectOverlay™ software module
    • Fits to microscope based from
      • Zeiss (Axio Observer, AxioVert 200)
      • Olympus (IX line)
      • Nikon (TE 2000, Ti)
      • Leica (DMI line)
  2. Stand-alone system
    • Maximum flexibility even if no fluorescence is needed (only 1 minute to mount the stage on an optical microscope)
    • Free access to the sample area

Highest data quality and output

  • 200,000 curves per 24 hours in unattended mode while varying parameters such as temperature or loading rate
  • Highest data density with virtually unlimited points per force curve

Automate your measurements

  • Intelligent and automated approach for soft landing even with functionalized tips
  • User-friendly automated laser and detector alignment eliminates cantilever drift for long term measurements
  • Automated sample positioning or mapping with high precision sample stages
  • Full remote instrument operation through internet

ForceRobot® 300 head

  • Rigid low-noise construction and drift-minimized mechanics based on our proven NanoWizard® design
  • Liquid-safe concept with integrated vapour barrier, special encapsulated piezo drives and tip moving design
  • Intelligent and automated approach with user defined parameters for different experiments
  • Automated laser and detector alignment for long term experiments
  • IR detection light source with low coherence
  • High detector bandwidth of 8 MHz for high speed signal capture
  • 980 nm wavelength detection light source for undisturbed fluorescence or Raman experiments
  • Built-in optical filters for fluorescence without crosstalk with the beam deflection detection
  • Built-in CCD camera for viewing the probe and sample
  • High-speed flexure stage with ultrafast z-response and closed loop control
  • Piezo options:
    • 6.5 μm z-range with fast response
    • 15 μm z-range for long pulling ranges (optional)
  • Z-sensor noise level: 0.06 nm RMS at 0.1-1 kHz bandwidth
  • Laser safety class 1

Control electronics

  • 4 high speed 16 bit ADCs with 60 MHz
  • High-speed data capture with optional burst mode
  • Modular analog and digital design with latest PPC technology (PowerPC @ 660 MHz)
  • Discrete analog high-speed high voltage amplifiers
  • Gigabit Ethernet interface for fast data link
  • Number of data points that can be captured continuously: restricted only by HDD
  • Thermal noise acquisition up to 3.25 MHz
  • connectors for maximum experimental freedom

View all control electronics options

SPMControl software

  • Fully automated data acquisition
  • Highest density of data points per force curve
  • Fully automated sensitivity and spring constant calibration
  • Automated re-calibration and cantilever drift compensation
  • JPK ExperimentPlanner™ for designing a dedicated measurement workflow
  • JPK RampDesigner™ for custom designed force curve segments
  • Advanced spectroscopy modes such as
    • Various force clamp modes
    • User-defined temperature ramps, pulling speed or force feedback
  • Enhanced force mapping capabilities
  • Automated online and offline advanced filtering of curves, based on multiple criteria e.g. force, length and loading rate ranges
  • Powerful batch processing including WLC, FJC, step fitting and other analysis
  • JPK‘s DirectOverlay™ feature as an option
  • Molecular recognition mapping

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Integrated flexibility from the widest range of accessories in the market

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Application examples

  • Protein (un)folding and receptor-ligand interactions
  • Analysis of adhesion forces of single macromolecules for surface chemistry and polymer science
  • Elastic response or melting of DNA
  • Single molecule mechanical properties, e.g. muscle proteins, synthetic biopolymers, carbohydrates or spider silk protein
  • Localization of binding of small molecules on proteins (e.g. inhibitors on membrane proteins)
  • Quantification of kinetics, affinity and energy landscapes of biological interactions
  • Colloidal probe and Nanoindentation experiments