
System specifications
ForceRobot® 300 is available in 2 configurations for sample positioning or mapping utilizing the same head
- ForceRobot® 300 MotorizedStage
- Travel range of 2 × 2cm²
- Step Size (Resolution) better than 1 μm
- Repeatability better than 1 μm
- ForceRobot® 300 PrecisionMappingStage
- Travel range of 100 × 100 μm² under closed loop control
- Position noise better than 0.3 nm closed loop
Both configurations can be used with inverted research microscopes or as stand-alone systems and work with JPK‘s DirectOverlay™ feature.
ForceRobot® 300 can be operated:
- On top of an inverted research microscope for Single Molecule Force Spectroscopy (SMFS) simultaneously with Fluorescence Microscopy
- Find a measurement spot optically on your sample by fluorescent labelling
- Combine SMFS with advanced optical techniques such as FCS, FRET, TIRF or optical tweezers
- Exact positioning and overlay of optical and force spectroscopy data with the JPK DirectOverlay™ software module
- Fits to microscope based from
- Zeiss (Axio Observer, AxioVert 200)
- Olympus (IX line)
- Nikon (TE 2000, Ti)
- Leica (DMI line)
- Stand-alone system
- Maximum flexibility even if no fluorescence is needed (only 1 minute to mount the stage on an optical microscope)
- Free access to the sample area
Highest data quality and output
- 200,000 curves per 24 hours in unattended mode while varying parameters such as temperature or loading rate
- Highest data density with virtually unlimited points per force curve
Automate your measurements
- Intelligent and automated approach for soft landing even with functionalized tips
- User-friendly automated laser and detector alignment eliminates cantilever drift for long term measurements
- Automated sample positioning or mapping with high precision sample stages
- Full remote instrument operation through internet
ForceRobot® 300 head
- Rigid low-noise construction and drift-minimized mechanics based on our proven NanoWizard® design
- Liquid-safe concept with integrated vapour barrier, special encapsulated piezo drives and tip moving design
- Intelligent and automated approach with user defined parameters for different experiments
- Automated laser and detector alignment for long term experiments
- IR detection light source with low coherence
- High detector bandwidth of 8 MHz for high speed signal capture
- 980 nm wavelength detection light source for undisturbed fluorescence or Raman experiments
- Built-in optical filters for fluorescence without crosstalk with the beam deflection detection
- Built-in CCD camera for viewing the probe and sample
- High-speed flexure stage with ultrafast z-response and closed loop control
- Piezo options:
- 6.5 μm z-range with fast response
- 15 μm z-range for long pulling ranges (optional)
- Z-sensor noise level: 0.06 nm RMS at 0.1-1 kHz bandwidth
- Laser safety class 1
Control electronics
- 4 high speed 16 bit ADCs with 60 MHz
- High-speed data capture with optional burst mode
- Modular analog and digital design with latest PPC technology (PowerPC @ 660 MHz)
- Discrete analog high-speed high voltage amplifiers
- Gigabit Ethernet interface for fast data link
- Number of data points that can be captured continuously: restricted only by HDD
- Thermal noise acquisition up to 3.25 MHz
- connectors for maximum experimental freedom
View all control electronics options
SPMControl software
- Fully automated data acquisition
- Highest density of data points per force curve
- Fully automated sensitivity and spring constant calibration
- Automated re-calibration and cantilever drift compensation
- JPK ExperimentPlanner™ for designing a dedicated measurement workflow
- JPK RampDesigner™ for custom designed force curve segments
- Advanced spectroscopy modes such as
- Various force clamp modes
- User-defined temperature ramps, pulling speed or force feedback
- Enhanced force mapping capabilities
- Automated online and offline advanced filtering of curves, based on multiple criteria e.g. force, length and loading rate ranges
- Powerful batch processing including WLC, FJC, step fitting and other analysis
- JPK‘s DirectOverlay™ feature as an option
- Molecular recognition mapping
Integrated flexibility from the widest range of accessories in the market
- Sample stages for all major inverted optical microscope manufactures such as Zeiss, Nikon, Olympus and Leica
- JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions
- Fluid cells and temperature control options for measurements from -120°C up to 300°C
- JPK‘s ForceWheel accessory for most sensitive experiment control
- Vibration and acoustic isolation from leading suppliers
Application examples
- Protein (un)folding and receptor-ligand interactions
- Analysis of adhesion forces of single macromolecules for surface chemistry and polymer science
- Elastic response or melting of DNA
- Single molecule mechanical properties, e.g. muscle proteins, synthetic biopolymers, carbohydrates or spider silk protein
- Localization of binding of small molecules on proteins (e.g. inhibitors on membrane proteins)
- Quantification of kinetics, affinity and energy landscapes of biological interactions
- Colloidal probe and Nanoindentation experiments