• Atomic resolution in closed-loop on inverted microscope (<0.025nm RMS z noise level)
  • Ultra-low noise level of cantilever deflection detection system <2pm RMS (0.1Hz-1kHz)
  • Best closed-loop AFM on the market for reproducible tip positioning and long time position stability
  • Tip-scanning stand-alone system, the only choice for simultaneous AFM and laser scanning experiments
  • IR deflection detection light source with low coherence for interference-free measurements
  • NanoWizard® ULTRA Speed can be operated:
    1. On top of an inverted research microscope for AFM simultaneously with optical microscopy
      • Find a measurement spot optically on your sample by fluorescent labeling
      • Combine AFM with advanced optical techniques such as confocal, FCS, FRET, FLIM, IRF, STED, PALM/STORM or others
      • Exact positioning and overlay of optical and AFM data with the JPK DirectOverlay™ software module
    2. Stand-alone based
      • Maximum flexibility even if no fluorescence is required (the sample stage can be mounted on an optical microscope within a minute)
      • Free access to the sample area for micropipettes or electrical connections
      • TopViewOptics™ optional
    3. BioMAT™ option
      • For high-NA optics combined with AFM on opaque samples

NanoWizard® ULTRA Speed head

  • Rigid low-noise design and drift-minimized mechanics
  • High detector bandwidth of 8MHz for high speed signal capture
  • Liquid-safe design with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
  • Intelligent and automated approach with user defined parameters for soft landing even with functionalized tips
  • Transmission illumination with standard condensers for precise bright-field, DIC and phase contrast
  • Built-in optical filters for fluorescence without crosstalk
  • Scanner unit
    • Flexure stage scanner design with decoupled, low mass z scanner
    • 30×30×6µm³ scan range in closed-loop mode for the head
    • >300 lines/sec
    • z resonance frequency >70kHz
    • Position noise level better 0.1nm RMS in xy (in closed-loop) and 0.04nm RMS sensor noise level in z (3kHz bw)

Vortis™ SPMControl electronics

  • State-of-the-art digital controller with lowest noise levels and highest flexibility

View all control electronics options

SPMControl software

  • True multi-user platform (perfect for imaging facilities)
  • User-programmable software
  • Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
  • Patented DirectOverlay™ for combined optical and AFM information
  • Outline™ mode for precise selection of a new scan area in the optical image
  • Improved ForceWatch™ mode for force spectroscopy and imaging for cantilever-drift free measurements
  • Comprehensive force measurement with TipSaver™
  • Advanced spectroscopy modes such as various force clamp modes or ramp designs, e.g. for temperature ramps, pulling speed or force feedback
  • Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
  • Powerful batch processing of force curves and images including
  • WLC, FJC, step-fitting, JKR, DMT model and other analyses

View all software modules

Integrated flexibility from the widest range of accessories in the market

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Standard Operating Modes

Imaging modes
  • Easy-to-use and intuitive QI™ mode with precise force control
  • Contact mode with lateral force microscopy (LFM)
  • AC modes with phase detection
Force measurements
  • Static and dynamic spectroscopy
  • Fast Force mapping

Optional modes

Imaging modes
  • QI™ Advanced mode for quantitative data
    • Mechanical properties such as adhesion, elasticity, stiffness, deformation
    • Conductivity and charge distribution mapping
    • Contact Point Imaging (CPI) with zero force
    • Molecular recognition imaging for binding site mapping
  • HyperDrive™ mode for highest resolution imaging in fluid
  • Advanced AC modes such as FM and PM with Q-control & Active Gain Control
  • Higher harmonics imaging
  • MicroRheology
  • Kelvin Probe Microscopy and SCM
  • MFM and EFM (see also QI™ mode)
  • Conductive AFM (see also QI™ mode)
  • STM
  • Electrical spectroscopy modes
  • Piezo-Response Microscopy
  • Electrochemistry with temperature control and optical microscopy
  • NanoLithography and NanoManipulation
  • Nanoindentation
  • Scanning Thermal AFM
  • JPK ExperimentPlanner™ for designing a dedicated measurement workflow
  • JPK RampDesigner™ for custom designed force curve segments for clamp and ramp experiments
  • ExperimentControl™ feature for remote experiment control
  • Environmental control options
  • DirectOverlay™ for combined AFM and optical microscopy
  • Additional xy or z sample movement stages available with CellHesion®, TAO™ and HybridStage™ module