Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.

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The JPK HybridStage™

Automated mapping of sample properties over a large area from millimeters to nanometers and with picoNewton force resolution.

Vortis™ 2 SPMControl station

    • State-of-the-art digital controller with lowest noise levels and highest number of signal channels
    • Optimized for PeakForce Tapping®

      Vortis™ 2 Advanced SPMControl station

      • State-of-the-art digital controller with lowest noise levels and highest number of signal channels
      • Video rate scanning performance with maximum data pixel rate up to 800.000 pixels/sec
      • Optimized for PeakForce Tapping®

      OT-AFM Combi-System/ ConnectorStage™

      Pow­er­ful Op­ti­cal Tweez­ers & AFM Com­bi­na­tion for force mea­sure­ments in 2D and 3D from 500fN to 10nN

      ForceRobot® 300 system option

      The innovative force spectroscope with fully automated work flow.

      TAO™ Tip Assisted Optics module

      Specialized sample stage for advanced experiments combining AFM and optical spectroscopy

      CellHesion® module

      The CellHesion® module combines the capabilities of the BioAFM with precise adhesion force measurements.

      NanoOptics system option

      • Version with fiber port for fiber SNOM experiments
      • UV transparency version for top/down illumination

      CellHesion® 200 system option

      The single cell force testing solution for cell adhesion and elasticity studies.

      BioMaterials Workstation BioMAT™

      Completely integrated system comprising upright optical microscope and AFM.

      DirectOverlay™ 2 software module

      Perfect optical integration enables direct correlation of AFM and optical data

      3D print option

      Free add-on for all JPK users: Create three-dimensional objects out of AFM images.

      ExperimentControl™

      Remote control and monitoring of complex and long-term experiments.

      QI™ Advanced mode

      The QI™-Advanced option delivers parameters like adhesion, stiffness, dissipation and more while scanning.

      ExperimentPlanner™

      For comprehensive planning of an experiment with all of the external parameters.

      Advanced Force Spectroscopy module

      For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.

      NanoLithography/ NanoManipulation module

      Software module for NanoWizard® systems.

      MicroRheology software module

      For visco-elastic properties of living cells and other samples such as gels or foams.

      HyperDrive™ fluid imaging package

      For highest resolution imaging of small structured samples in liquid.

      CoverslipHolder with electrical sample connection

      The CoverslipHolder with electrical sample connection is designed for electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics.

      Electrical sample connection module

      Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.

      Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module

      Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module. Option for nanoscale mapping of surface potential distribution.

      Conductive AFM (CAFM) module

      For conductivity and I/V measurements on the nanoscale.

      Conductive AFM module - enclosed volume

      For experiments in inert atmosphere; for conductivity and I/V measurements on the nanoscale under controlled environmental conditions.

      TC-CAFM module

      Tunneling Current Conductive AFM (TC-CAFM) module for low-conducting samples

      Scanning Tunnelling Microscopy (STM) module

      The Scanning Tunnelling Microscopy (STM) module fits directly to the NanoWizard® head.

      High Voltage Sample Bias Amplifier

      Can be used for biasing a sample, e.g., in electro-optical experiments or in Piezo-Response Force Microscopy (PFM).

      Force Wheel

      JPK‘s ForceWheel™ handheld accessory for most sensitive experiment control, e.g., for force spectroscopy.

      Head-up stage

      For tall samples up to 140mm height

      HybridStage™

      Automated mapping of sample properties over a large range for structured substrates, microspheres, cells. etc.

      StretchingStage

      For sample property changes under external mechanical load up to 200N

      StretchingStage for higher forces

      Enables sample property changes under external mechanical load up to 5000N or 10000N

      Motorized precision stage

      Offers automatic motion control for precise positioning of the sample relative to optical axis and AFM probe.

      Standard stage

      Offers fine motion control for precise positioning of the AFM tip relative to the sample.

      Sample holder for large samples

      The holder can accommodate larger samples such as microchips or wafers and is equipped with spring clips which can be varied.

      Cantilever holders

      • Standard holder for all-round applications with a large optical field of view
      • Supercut version for use in air or liquids with removable cantilever spring for maximum cleaning results.

      Side-view cantilever holder

      This holder is designed for use in combination with inverted optical microscopes to observe the cantilever region from the side.

      Cantilever holders for electrical and magnetic experiments

      • Cantilever holder with electrical tip connection
      • Magnetic field cantilever holder for magnetic actuation

      BioCell™ for AFM

      Coverslip based fluid cell for Live Cell imaging and single molecule fluorescence with temperature control and perfusion1

      CoverslipHolder

      • closed liquid cell with standard coverslip bottom
      • high-N.A. immersion optics possible
      • autoclavable

      PetriDishHeater™

      • for Live Cell imaging
      • accomodates 35 mm Petri dishes even with glass bottom

      SmallCell™

      The perfect solution for smallest volume experiments in a hermetically sealed environment, two versions available for volumes <150µl and <60µl.

      High Temperature Heating Stage - HTHS™

      Designed for polymer science and phase separation studies from ambient up to 300°C with a resolution of 0.1°C and minimized drift in all dimensions.

      Heating Cooling Module - HCM™

      Designed for heating and cooling experiments in gas or liquids with minimized drift in all dimensions.

      Heating Cooling Stage - HCS™

      Designed for AFM experiments in air or liquids from 0°C up to 100°C with minimized drift in all dimensions – HCS™ follows the same design criteria as HTHS™.

      CryoStage

      JPK offers specialized cryostages together with NanoWizard® systems for cooling applications down to -120°C.

      ECCell™

      • works with transparent or non-transparent substrates
      • temp. range from ambient to 60°C
      • max. 1350µL liquid volume

      HCS™ with electrochemistry cell

      Designed for electrochemistry AFM experiments with controlled heating and cooling of the sample.

      Potentiostats from IPS

      JPK offers third party potentiostats for electrochemistry applications together with NanoWizard® systems.

      Vibration isolation systems

      from Accurion, Table Stable and TMC

      JPK Acoustic Enclosure

      Approved for high performance applications: acoustic hood from JPK for utmost stability and isolation, with temperature control option.

      JPK base for acoustic enclosure

      Approved for high performance applications: base frame with top plate from JPK for utmost stability.

      TopViewOptics™ module

      Optical system to view tip and sample during experiments on opaque samples

      TopViewOptics™

      The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, metall etc.

      TopViewOptics™ with boom stand

      The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, implants etc. Can be used in combination with inverted microscopes.

      TopViewOptics™ for use with inverted optical microscopes

      The optical system for use with inverted optical microscopes or the JPK BioMAT™.

      Raman reflector kit

      Raman reflector kit for Tip-Enhanced Raman Scattering (upright-TERS) on opaque samples.

      Upright Fluorescence Microscope (UFM) Kit

      The Upright Fluorescence Microscope (UFM) Kit enables the combined use of AFM and upright fluorescence zoom microscopy.

      FluidFM® ADD-ON from Cytosurge

      This technology enables easy handling of liquid volumes at the femtoliter scale by providing a range of hollow cantilever designs.

      JPK sample holder for small samples

      Adaptor for standard sample holder. Holds magnetically fixed AFM metal stubs.

      JPK cable anchorage pillow

      Heavy weight pillow for fixation of cables to reduce noise coupling.

      JPK cantilever changing tool

      Probe loading station for convenient cantilever exchange.

      JPK bio-compatible glue

      For cantilever or sample fixation, easy removable and bio-compatible (2x 4ml).

      Syringe pumps

      from World Precision Instruments (WPI)

      Fluidics Module

      JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions

      Cantilever shop

      Cantilevers for standard contact and AC mode, high-resolution EBD tip cantilevers, chemically functionalized cantilevers, test grids, substrates and more

      CCD, EMCCD and CMOS cameras

      JPK supplies cameras from all major manufacturers, e.g., Andor® Technology, Jenoptik, The Imaging Source and IDS Imaging Development Systems.

      Modular Glove Box system

      Turnkey solution for environmental control of measurements with the JPK NanoWizard® AFM family

      Scanning Thermal Microscopy module - SThM

      from AppNano. The technique generates simultaneous nanoscale thermal images and contact mode images.