Specifications

  • Atomic lattice resolution
  • Low noise level of cantilever deflection detection system < 15 pm RMS
  • Closed-loop for reproducible tip positioning and long time position stability
  • Tip-scanning stand alone system, the only choice for simultaneous AFM and optical experiments
  • IR deflection detection laser source with low coherence for interference-free measurements
  • NanoWizard® Sense can be operated
    1. On top of an inverted research microscope for AFM simultaneously with optical microscopy
      • Find a measurement spot optically on your sample by
        fluorescent labeling
      • Combine AFM with advanced optical techniques such as confocal, FCS, FRET, TIRF, STED, STORM/PALM or others
      • Exact positioning and overlay of optical and AFM data with the JPK DirectOverlay™ software module
    2. Stand-alone based
      • Maximum flexibility even if no fluorescence is needed (the sample stage can be mounted on an optical microscope within a minute)
      • Free access to the sample area for micropipettes or electrical connections
      • Optional TopViewOptics™ vertical viewing system
  • The system can easily be upgraded to a full NanoWizard® 4 AFM system.

NanoWizard® Sense head

  • Rigid low-noise design and drift-minimized mechanics
  • Liquid-safe design with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
  • Intelligent and automated approach optional with user defined parameters for soft landing
  • Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
  • Built-in optical filters for fluorescence without crosstalk
  • Scanner unit
    • Flexure stage scanner design with decoupled, low mass z scanner
    • 100 × 100 × 15 μm³ scan range for the head

Sense SPMControl electronics

  • State-of-the-art digital controller with lowest noise levels

View all control electronics options

SPMControl software

  • True multi-user platform
  • User-programmable software
  • Automated sensitivity and spring constant calibration using thermal noise method
  • Outline™ mode for precise selection of a new scan area even in the optical image
  • Improved ForceWatch™ mode for force spectroscopy and imaging for cantilever-drift free measurements
  • Advanced oscilloscope functionality and online measurement of distances, cross sections etc.
  • Unlimited pixel resolution for imaging or force curves
  • Comprehensive force measurement with TipSaver™
  • Advanced spectroscopy modes such as various force clamp modes or user-defined ramp design, e.g. for temperature ramps, pulling speed or force feedback (optional)
  • Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section etc.
  • DataProcessing Image-Viewer for picture-in-picture display and export, including calibrated optical images
  • Powerful batch processing of force curves including WLC, FJC, step-fitting and other analysis
  • Image batch processing

View all software modules

Integrated flexibility from the widest range of accessories in the market

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Standard Operating Modes

Imaging modes
  • Contact mode with lateral force microscopy (LFM)
  • AC modes with Q-control
  • Phase detection
Force spectroscopy (air or liquid)
  • Static and dynamic spectroscopy and mapping

Optional Modes

Imaging modes
  • QI™ and QI™ Advanced mode for quantitative imaging of mechanical, electrical and magnetic properties
  • MFM and EFM (see also QI™ mode)
  • Conductive AFM (see also QI™ mode)
  • STM
  • Piezo-Response Microscopy
  • Electrical spectroscopy modes
  • Electrochemistry with temperature control and optical microscopy
  • NanoLithography and NanoManipulation
  • ExperimentControl™ feature for remote experiment control
  • JPK ExperimentPlanner™ for designing a dedicated measurement workflow
  • JPK RampDesigner™ for custom designed force curve segments for clamp and ramp experiments
  • Nanoindentation
  • Scanning Thermal AFM
  • Environmental control options
  • DirectOverlay™ for combined AFM and optical microscopy
  • Additional z stage available with CellHesion® module