
Specifications
- Head in 2 versions available
- UV transparency version for top view sample illumination with UV-light
- Fiber port version for fiber SNOM applications
- Atomic lattice resolution on inverted microscope in closed-loop (< 0.030nm RMS z noise level)
- Ultra-low noise level of cantilever deflection detection system <2pm RMS (0.1Hz-1kHz) and high detector bandwidth of 8MHz for high speed signal capture
- Tip-scanning, stand-alone system, with a rigid low-noise design and drift-minimized mechanics – the best choice for simultaneous AFM and laser scanning (LSM) experiments
- IR deflection detection light source with low coherence for interference-free measurements
- The only liquid-safe AFM with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
- Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
- Scanner unit
- Best closed-loop AFM on the market for reproducible tip positioning and long time position stability
- 100 x 100 x 15μm3 scan range
- Position noise level <0.15nm RMS in xy (in closed-loop) and 0.06nm RMS sensor noise level in z (3kHz bw)
Vortis™ SPMControl electronics
- State-of-the-art digital controller with lowest noise levels and highest flexibility
View all control electronics options
SPMControl software
- True multi-user platform (perfect for imaging facilities)
- User-programmable software
- Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
- Patented DirectOverlay™ for combined optical and AFM information
- Outline™ mode for precise selection of a new scan area in the optical image
- Improved ForceWatch™ mode for force spectroscopy and imaging for cantilever-drift free measurements
- Comprehensive force measurement with TipSaver™
- Advanced spectroscopy modes such as various force clamp modes or ramp designs, e.g. for temperature ramps, pulling speed or force feedback
- Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
- Powerful batch processing of force curves and images including
- WLC, FJC, step-fitting, JKR, DMT model and other analyses
Integrated flexibility from the widest range of accessories in the market
- Stages and sample holders for all major inverted optical microscope manufactures such as Zeiss, Nikon, Olympus and Leica
- Fluid cells and temperature control options for measurements from -120°C up to 300°C
- Electrochemistry solutions and accessories for electrical and magnetic measurements
- Vibration and acoustic isolation from leading suppliers
Standard Operating Modes
Imaging modes
- Easy-to-use and intuitive QI™ mode with precise force control
- Contact mode with lateral force microscopy (LFM)
- AC modes with phase detection
Force measurements
- Static and dynamic spectroscopy
- Fast Force mapping
Optional Modes
Imaging modes
- Fast scanning option up to 100 lines/sec
- QI™ Advanced mode for quantitative data
- Mechanical properties such as adhesion, elasticity, stiffness, deformation
- Conductivity and charge distribution mapping
- Contact Point Imaging (CPI) with zero force
- Molecular recognition imaging for binding site mapping
- HyperDrive™ mode for highest resolution imaging in fluid
- Advanced AC modes such as FM and PM with Q-control & Active Gain Control
- Higher harmonics imaging
- MicroRheology
- Kelvin Probe Microscopy and SCM
- MFM and EFM (see also QI™ mode)
- Conductive AFM (see also QI™ mode)
- STM
- Electrical spectroscopy modes
- Piezo-Response Microscopy
- Electrochemistry with temperature control and optical microscopy
- NanoLithography and NanoManipulation
- Nanoindentation
- Scanning Thermal AFM
- JPK ExperimentPlanner™ for designing a dedicated measurement workflow
- JPK RampDesigner™ for custom designed force curve segments for clamp and ramp experiments
- ExperimentControl™ feature for remote experiment control
- Environmental control options
- DirectOverlay™ for combined AFM and optical microscopy
- Additional xy or z sample movement stages available with CellHesion®, TAO™ and HybridStage™ module