Specifications

Head in 2 versions available
- UV transparency version for top view sample illumination with UV-light
- Fiber port version for fiber SNOM applications
Atomic lattice resolution on inverted microscope in closed-loop (< 0.030nm RMS z noise level)
Ultra-low noise level of cantilever deflection detection system <2pm RMS (0.1Hz-1kHz) and high detector bandwidth of 8MHz for high speed signal capture
Tip-scanning, stand-alone system, with a rigid low-noise design and drift-minimized mechanics – the best choice for simultaneous AFM and laser scanning (LSM) experiments
IR deflection detection light source with low coherence for interference-free measurements
The only liquid-safe AFM with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
Scanner unit
- Best closed-loop AFM on the market for reproducible tip positioning and long time position stability
- 100 x 100 x 15μm³ scan range
- Position noise level <0.15nm RMS in xy (in closed-loop) and 0.06nm RMS sensor noise level in z (3kHz bw)

Vortis™ SPMControl electronics

State-of-the-art digital controller with lowest noise levels and highest flexibility

True multi-user platform (perfect for imaging facilities)
User-programmable software
Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
Patented DirectOverlay™ for combined optical and AFM information
Outline™ mode for precise selection of a new scan area in the optical image
Improved ForceWatch™ mode for force spectroscopy and imaging for cantilever-drift free measurements
Comprehensive force measurement with TipSaver™
Advanced spectroscopy modes such as various force clamp modes or ramp designs, e.g. for temperature ramps, pulling speed or force feedback
Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
Powerful batch processing of force curves and images including
WLC, FJC, step-fitting, JKR, DMT model and other analyses

Stages and sample holders for all major inverted optical microscope manufactures such as Zeiss, Nikon, Olympus and Leica
Fluid cells and temperature control options for measurements from -120°C up to 300°C
Electrochemistry solutions and accessories for electrical and magnetic measurements
Vibration and acoustic isolation from leading suppliers

Fast scanning option up to 100 lines/sec
QI™ Advanced mode for quantitative data
- Mechanical properties such as adhesion, elasticity, stiffness, deformation
- Conductivity and charge distribution mapping
- Contact Point Imaging (CPI) with zero force
- Molecular recognition imaging for binding site mapping
HyperDrive™ mode for highest resolution imaging in fluid
Advanced AC modes such as FM and PM with Q-control & Active Gain Control
Higher harmonics imaging
MicroRheology
Kelvin Probe Microscopy and SCM
MFM and EFM (see also QI™ mode)
Conductive AFM (see also QI™ mode)
STM
Electrical spectroscopy modes
Piezo-Response Microscopy
Electrochemistry with temperature control and optical microscopy
NanoLithography and NanoManipulation
Nanoindentation
Scanning Thermal AFM
JPK ExperimentPlanner™ for designing a dedicated measurement workflow
JPK RampDesigner™ for custom designed force curve segments for clamp and ramp experiments
ExperimentControl™ feature for remote experiment control
Environmental control options
DirectOverlay™ for combined AFM and optical microscopy
Additional xy or z sample movement stages available with CellHesion®, TAO™ and HybridStage™ module