One system for all nano-force applications: The combined high-end solution for JPK Scanning Probe Microscopes and Optical Tweezers systems.
Where performance meets flexibility - benefit from the widest range of accessories in the market
Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.
- State-of-the-art digital controller with lowest noise levels.
- 4 high speed 16bit ADC channels with 60 MHz
- 12 ADCs with 18bit with 800 kHz
Specialized sample stage for advanced experiments combining AFM and optical spectroscopy
The CellHesion® module combines the capabilities of the BioAFM with precise adhesion force measurements.
The single cell force testing solution for cell adhesion and elasticity studies.
Completely integrated system comprising upright optical microscope and AFM.
Remote control and monitoring of complex and long-term experiments.
The QI™-Advanced option delivers parameters like adhesion, stiffness, dissipation and more while scanning.
Allows customized experimental procedures, including control of external equipment
For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.
Perfect integration of optical and AFM data – JPK‘s proprietary and patented solution for perfect overlay of optical and AFM information.
Software module for NanoWizard® systems.
For visco-elastic properties of living cells and other samples such as gels or foams.
For highest resolution imaging of soft samples in air and liquid
For electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics
Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.
Option for nanoscale mapping of surface potential distribution
For high-performance conductivity experiments
For high-performance conductivity experiments under controlled environmental conditions
For low-conducting samples
Tip-bias wire holder with integrated current amplifier circuit and automatic samp-le grounding
For biasing a sample, e.g., in electro-optical experiments or in Piezoresponse Force Microscopy (PFM) and piezo hysteresis mapping
For most sensitive experiment control, e.g. force fishing experiments
For tuning fork-based feedback modes e.g. fiber-SNOM or TERS
For sample property changes under external mechanical load up to 200N
Enables sample property changes under external mechanical load up to 5000N or 10000N
Automated mapping of sample properties over a large range for structured substrates, microspheres, cells. etc.
Offers automatic motion control for precise positioning of the sample relative to optical axis and AFM probe.
For tall samples up to 140mm height
Offers fine motion control for precise positioning of the AFM tip relative to the sample.
The holder can accommodate larger samples such as microchips or wafers and is equipped with spring clips which can be varied.
- Standard holder for all-round applications with a large optical field of view
- Supercut version for use in air or liquids with removable cantilever spring for maximum cleaning results.
For use in combination with inverted optical microscopes to observe the cantilever region from the side.
For use in air with a fixed cantilever spring and an electrical tip connection
Coverslip based fluid cell for Live Cell imaging and single molecule fluorescence with temperature control and perfusion1
- closed liquid cell with standard coverslip bottom
- high-N.A. immersion optics possible
- for Live Cell imaging
- accomodates 35 mm Petri dishes even with glass bottom
The perfect solution for smallest volume experiments in a hermetically sealed environment, two versions available for volumes <150µl and <60µl.
Designed for polymer science and phase separation studies from ambient up to 300°C with a resolution of 0.1°C and minimized drift in all dimensions.
Designed for heating and cooling experiments in gas or liquids with minimized drift in all dimensions.
Designed for AFM experiments in air or liquids from 0°C up to 100°C with minimized drift in all dimensions – HCS™ follows the same design criteria as HTHS™.
JPK offers specialized cryostages together with NanoWizard® systems for cooling applications down to -120°C.
- works with transparent or non-transparent substrates
- temp. range from ambient to 60°C
- max. 1350µL liquid volume
Designed for electrochemistry AFM experiments with controlled heating and cooling of the sample.
Potentiostats from Bruker and third parties, e.g. from IPS, for electrochemistry applications together with NanoWizard systems.
Approved for high performance applications: acoustic hood from JPK for utmost stability and isolation, with temperature control option.
Approved for high performance applications: base frame with top plate from JPK for utmost stability.
Raman reflector kit for Tip-Enhanced Raman Scattering (upright-TERS) on opaque samples.
The Upright Fluorescence Microscope (UFM) Kit enables the combined use of AFM and upright fluorescence zoom microscopy.
The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, metall etc.
The optical system for use with inverted optical microscopes or the JPK BioMAT™.
Allows the precise capture of light emitted by the SPM tip region into a fiber coupled detector for home-build SNOM or other light emitting tip experiments.
Adaptor for standard sample holder. Holds magnetically fixed AFM metal stubs.
For cantilever or sample fixation, easy removable and bio-compatible (2x 4ml).
JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions
Cantilevers for standard contact and AC mode, high-resolution EBD tip cantilevers, chemically functionalized cantilevers, test grids, substrates and more