Highest flexibility combined with extreme performance

The NanoWizard® 4 XP NanoScience atomic force microscope delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques. A wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties, makes it the most flexible system available on the market today.


The image shows atomic lattice resolution on calcite, taken in closed loop.

The NanoWizard 4 XP NanoScience is equipped with a range of new features, including:

  • PeakForce Tapping® for easy imaging
  • Fast Scanning option with up to 150 lines/sec
  • NestedScanner Technology for high-speed imaging of surface structures up to 16.5µm with outstanding resolution and stability
  • New tiling functionality for automated analysis of large sample areas
  • V7 Software with revolutionary new workflow-based user interface
  • DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
  • Vortis™ 2 controller for high-speed signal processing and lowest noise levels


Phase images showing dynamic growth front of a poly-hydroxybutyrate-co-valerate (PHB/V) spherulite crystallization. Line rate: 150 lines/sec.

PeakForce Tapping provides superior force control and an uncomplicated setup, no matter what the sample or environment. No expert knowledge or cantilever tuning is necessary. It enables precise control of probe-to-sample interactions and minimizes imaging forces, thereby protecting your tip and ensuring consistent, long-term, high-resolution imaging.


PeakForce Tapping images of Isotactic Polypropylene (IPP) dropcast as a thin film. Topography overview image with inset region marked. Height range: 50nm. Topography zoom into marked region. Height range: 25nm.

Automated analysis of large sample areas with new tiling functionality

The fastest and easiest way to navigate is to see where you want to go. DirectOverlay 2 provides instant navigation, with direct selection of measurement positions anywhere within the scanner range. The Motorized Precision Stage and HybridStage™ free experiments of the lateral constraints of the AFM piezo range, and allow direct motorized movement to selected positions.

The new DirectTiling feature automatically creates a large optical overview to accelerate this process. Multiscan enables tiling of high-resolution images to build up a comprehensive overview of the sample. Repetitive or complicated measurement sequences can be automated using ExperimentPlanner™ macros.


PDMS stamped surface pattern, sample courtesy of Dr. Claudio Canale, University of Genoa, Italy. Optical image of reference pattern. Four square regions are marked with a concentric corner pattern, the inner corners form a 50 micron square with test patterns printed in the center, but not visible in the optics. Imported into the SPM software with DirectOverlay, such images allow single-click navigation between reference positions separated by many times the piezo range. QI Advanced images of two such reference patterns (see arrows), topography + and adhesion images + .

Enhanced mapping of material properties

KPM on SRAM EFM on SRAM CAFM on CU conduct layer The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK's QI™-Advanced mode capabilities make this easy and straight forward. The NanoWizard 4 XP NanoScience system is supported by a comprehensive range of modes and accessories, each designed for easy handling and to meet the individual needs of researchers. Many experiments investigating material properties, including electrical properties, benefit from working in an enclosed cell to measure under a controlled inert gas atmosphere.

KPM on SRAM, EFM on SRAM and CAFM on CU conduct layer (click on the images for details).

Characterization of material properties

  • Mechanical properties (elasticity, stiffness, adhesion, deformation)
  • Electrical properties with Electrical Force Microscopy, Conductive-AFM, Kelvin Probe AFM (KPM), Scanning Tunneling Microscopy (STM)
  • Magnetic properties with MFM
  • Electro-optical properties with photo-conductive AFM
  • Local thermal properties by scanning thermal AFM

Height and MFM image of NiFe rectangular magnetic structure (click on the image for details).



In-Situ AFM while applying external loads to change sample properties

  • Piezoresponse Microscopy with high Voltages (PFM)
  • Observe samples under external load with the StretchingStage
  • Apply external magnetic fields
  • Electrochemistry and scanning electrochemistry (SECM)

Plastic film before and after stretching (click on the image for details).


Sample environmental control options

  • Sample heating from ambient to 300°C
  • Sample cooling from ambient to – 35°C
  • Cryo-AFM down to – 150°C with the CryoStage
  • Defined sample humidity
  • Perfect for experiments in fluids even harsh fluids
  • Experiments with controlled gas flow
  • Experiments in demanding environments in a glove box

NanoWizard 4 XP setup with CryoStage and crystalline polyethylene measured at -120°C.

New workflow-based user interface redefines user-friendliness

The new V7 software interface guides users through the workflow to set up experiments intuitively and makes it simple, even for users with minimal AFM experience, to progress confidently to generating high-quality data. Each stage of the setup and operation works as an optimized desktop that brings all the vital information into focus with a single click.

  • On-screen, context-sensitive help
  • Status feedback for alignment and setup
  • Efficient task-based experiment selection
  • Fast access to favorite and recently used experiments
  • One-click probe calibration
  • Instant overview of the key data.
  • User management for Multi-User environments like imaging facilities

Key features


  • Now with Bruker’s exclusive PeakForce Tapping as standard
  • Fast Scanning option with up to 150 lines/sec for increased productivity
  • Atomic lattice resolution on inverted microscopes combined with a large scan field of 100 × 100 × 15 µm3
  • New workflow-based user interface for ergonomics and ease of operation
  • New tiling functionality for automated analysis of large sample areas together with the HybridStage
  • Enhanced DirectOverlay 2 mode for most precise correlative microscopy
  • New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
  • Highest flexibility and upgradeability with a broad range of modes and accessories


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