Where performance meets flexibility - benefit from the widest range of accessories in the market
Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.
- High-performance digital SPM controller with lowest noise levels and highest number of signal channels
- Video rate scanning performance with maximum data pixel rate up to 800.000 pixels/sec
- Optimized for PeakForce Tapping®
The innovative force spectroscope with fully automated work flow.
Specialized sample stage for advanced experiments combining AFM and optical spectroscopy
The CellHesion® module combines the capabilities of the BioAFM with precise adhesion force measurements.
- Version with fiber port for fiber SNOM experiments
- UV transparency version for top/down illumination
The single cell force testing solution for cell adhesion and elasticity studies.
Completely integrated system comprising upright optical microscope and AFM.
Bruker's exclusive software mode for easy imaging without any expert knowledge
Perfect optical integration enables direct correlation of AFM and optical data
Provides a clear visual overview, allowing a fast setup of optically guided experiments.
Remote control and monitoring of complex and long-term experiments.
The QI™-Advanced option delivers parameters like adhesion, stiffness, dissipation and more while scanning.
Software module for NanoWizard systems
Allows customized experimental procedures, including control of external equipment
For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.
Software module for NanoWizard® systems.
For visco-elastic properties of living cells and other samples such as gels or foams.
Tip-bias wire holder with integrated current amplifier circuit and automatic samp-le grounding
For biasing a sample, e.g., in electro-optical experiments or in Piezoresponse Force Microscopy (PFM) and piezo hysteresis mapping
For biasing a sample to low voltages, e.g., in electro-optical experiments or in Piezoresponse Force Microscopy (PFM) and piezo hysteresis mapping
For high-performance conductivity experiments
For high-performance conductivity experiments under controlled environmental conditions
For low-conducting samples
For low-conducting sample experiments under controlled environmental conditions
Option for nanoscale mapping of surface potential distribution
For nanoscale mapping of surface potential distribution under controlled environmental conditions
For tuning fork-based feedback modes e.g. fiber-SNOM or TERS
For TAO module, CellHesion module and HybridStage
For electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics
Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.
From Bruker Anasys, for thermal conductivity experiments
For highest resolution imaging of soft samples in air and liquid
Fast scanning option for NanoWizard 4 and NanoWizard 4 XP
For viscoelastic property measurements of gels, cells and tissues
For most sensitive experiment control, e.g. force fishing experiments
For tall samples up to 140mm height
Automated mapping of sample properties over a large range for structured substrates, microspheres, cells. etc.
Offers fine motion control for precise positioning of the AFM tip relative to the sample.
Offers sub-micron resolution & fine motion control for precise positioning of the AFM tip relative to optical axis and the sample
Offers automatic motion control for precise positioning of the sample relative to optical axis and AFM probe.
The holder can accommodate larger samples such as microchips or wafers and is equipped with spring clips which can be varied.
Standard holder for all-round applications
For all-round applications with a large optical field of view
For use in combination with inverted optical microscopes to observe the cantilever region from the side.
For use in air with a fixed cantilever spring and an electrical tip connection
For use under controlled environmental conditions with a s-shaped spring and an electrical tip connection
Coverslip based fluid cell for Live Cell imaging and single molecule fluorescence with temperature control and perfusion1
Designed for polymer science and phase separation studies from ambient up to 300°C with a resolution of 0.1°C and minimized drift in all dimensions.
Designed for heating and cooling experiments in gas or liquids with minimized drift in all dimensions.
Designed for AFM experiments in air or liquids from 0°C up to 100°C with minimized drift in all dimensions – HCS™ follows the same design criteria as HTHS™.
Designed for electrochemistry AFM experiments with controlled heating and cooling of the sample.
JPK offers specialized cryostages together with NanoWizard® systems for cooling applications down to -120°C.
The perfect solution for smallest volume experiments in a hermetically sealed environment, two versions available for volumes <150µl and <60µl.
- works with transparent or non-transparent substrates
- temp. range from ambient to 60°C
- max. 1350µL liquid volume
- closed liquid cell with standard coverslip bottom
- high-N.A. immersion optics possible
- for Live Cell imaging
- accomodates 35 mm Petri dishes even with glass bottom
Approved for high performance applications: acoustic hood from JPK for utmost stability and isolation, with temperature control option.
Approved for high performance applications: base frame with top plate from JPK for utmost stability.
Optical system to view tip and sample during experiments on opaque samples
The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, metall etc.
The optical system for use with inverted optical microscopes or the JPK BioMAT™.
The Upright Fluorescence Microscope (UFM) Kit enables the combined use of AFM and upright fluorescence zoom microscopy.
Raman reflector kit for Tip-Enhanced Raman Scattering (upright-TERS) on opaque samples.
This technology enables easy handling of liquid volumes at the femtoliter scale by providing a range of hollow cantilever designs.
Potentiostats from Bruker and third parties, e.g. from IPS, for electrochemistry applications together with NanoWizard systems.
Adaptor for standard sample holder. Holds magnetically fixed AFM metal stubs.
For sample property changes under external mechanical load up to 200N
Enables sample property changes under external mechanical load up to 5000N or 10000N
Probe loading station for convenient cantilever exchange.
For cantilever or sample fixation, easy removable and bio-compatible (2x 4ml).