Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.


Latest add-ons

FluidFM® ADD-ON from Cytosurge for advanced single cell, spectroscopy and nanomanipulation experiments

OT-AFM Combi-System/ ConnectorStage™ for combining NanoWizard® and NanoTracker™

HyperDrive™ fluid imaging package

For highest resolution imaging of small structured samples in liquid.

CoverslipHolder with electrical sample connection

The CoverslipHolder with electrical sample connection is designed for electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics.

Electrical sample connection module

Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.

Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module

Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module. Option for nanoscale mapping of surface potential distribution.

Conductive AFM (CAFM) module

For conductivity and I/V measurements on the nanoscale.

Conductive AFM module - enclosed volume

For experiments in inert atmosphere; for conductivity and I/V measurements on the nanoscale under controlled environmental conditions.

TC-CAFM module

Tunneling Current Conductive AFM (TC-CAFM) module for low-conducting samples

Scanning Tunnelling Microscopy (STM) module

The Scanning Tunnelling Microscopy (STM) module fits directly to the NanoWizard® head.

High Voltage Sample Bias Amplifier

Can be used for biasing a sample, e.g., in electro-optical experiments or in Piezo-Response Force Microscopy (PFM).

Force Wheel

JPK‘s ForceWheel™ handheld accessory for most sensitive experiment control, e.g., for force spectroscopy.