Imaging modes - practicalities

Contact mode
In conctact mode, the tip never leaves the surface, so this mode can be used for very high resolution imaging, such as atomic resolution of inorganic crystals or the images of protein crystals showing the subunits of the proteins. The maximum vertical force is also controlled, so the compression of the sample can be limited.The lateral forces as the tip moves over the surface can be a problem in some situations, but can actually be an advantage in other situations. The lateral deflection can give information about the friction between the tip and the sample, and can show areas that may have the same height, but different chemical properties.In contact mode, the setpoint value is the deflection of the cantilever, so a lower value of the setpoint gives a lower imaging force.

AFM - contact mode

Intermittent contact mode
In intermittent conctact mode, the tip is not in contact with the surface for most of the oscillation cycle. The lateral forces can therefore be much lower, and this mode can be used for imaging samples such as molecules that are not firmly stuck down on the surface, without moving them around.

AFM - intermittent contact mode
The cantilever is usually driven close to a resonance of the system, to give a reasonable amplitude for the oscillation and also to provide phase information. The phase of the cantilever oscillation can give information about the sample properties, such as stiffness and mechanical information or adhesion. The resonant frequency of the cantilever depends on its mass and spring constant; stiffer cantilevers have higher resonant frequencies.

In intermittent contact mode, the setpoint value is the amplitude of the oscillation, so a higher setpoint value means less damping by the sample and hence a lower imaging forces.

AFM - resonance curve
Cantilevers and spring constants
Different imaging modes tend to use cantilevers with different properties. In contact mode, the deflection of the cantilever is controlled as the tip is scanned over the surface. A softer cantilever means that a lower force can be used to give the same deflection. Often lower forces give better imaging, so the softest cantilevers are generally used for contact mode imaging. Many cantilevers are available with spring constants (k) below 0.5 N/m.Stiffer cantilevers are usually used for intermittent contact mode, particularly in air. These generally have a resonant frequency of 200 - 400 kHz, and spring constants of more than 10 N/m. These stiffer cantilevers give more stable imaging in air, since the cantilever is able to break free of the capillary forces when the tip touches the sample. As there can be very low average deflection values during careful imaging, the stiffer cantilevers do not damage the surface.
AFM - cantilever spring constant

For intermittent contact mode in liquid, the capillary force is not a problem, and softer cantilevers are often used. "Contact mode" cantilevers are often used for intermittent contact mode in liquid conditions. The resonant frequencies are much lower, and the damping of the liquid around the cantilever has a strong effect on the resonance.

more about cantilevers...

The spring constant of a cantilever can be estimated from its geometry and the properties of the material it is made from. The spring constant depends very strongly on the thickness of the cantilever, however, and this can be difficult to measure accurately. If a calibrated reference cantilever is available, then the cantilevers can be pushed against one another to compare the deflection of one cantilever by the other, and hence measure the spring constant of the unknown cantilever.

For soft cantilevers, another option is to measure the thermal noise and calculate the spring constant. This is an attractive option, since the cantilever is not damaged by the measurement, and no extra equipment is required.

 

Easy introduction to AFM
Easy introduction to SNOM
Easy introduction to Cantilevers

Scanning Probe Microscopy - SPM
Atomic Force Microscopy - AFM
Imaging modes - introduction
Imaging modes - practicalities
Imaging modes - applications
Force spectroscopy - introduction
Force spectroscopy - applications

Sample preparation