Atomic force microscopy

The atomic force microscope (AFM) is one of the family of scanning probe microscopes, and is widely used in biological applications. The AFM uses a flexible cantilever as a type of spring to measure the force between the tip and the sample. The basic idea of an AFM is that the local attractive or repulsive force between the tip and the sample is converted into a bending, or deflection, of the cantilever. The cantilever is attached to some form of rigid substrate that can be held fixed, and depending whether the interaction at the tip is attractive or repulsive, the cantilever will deflect towards or away from the surface.

This cantilever deflection must be detected in some way and converted into an electrical signal to produce the images. The detection system that has become the standard method for AFM uses a laser beam that is reflected from the back of the cantilever onto a detector. The optical lever principle is used, which means that a small change in the bending angle of the cantilever is converted to a measurably large deflection in the position of the reflected spot.


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The position of the laser spot is measured by comparing the signals from different sections of the detector. Most AFMs use a photodiode that is made of four quadrants, so that the laser spot position can be calculated in two directions, by comparing the signals. The vertical deflection (measuring the interaction force) can be calculated by comparing the amount of signal from the "top" and "bottom" halves of the detector. The lateral twisting of the cantilever can also be calculated by comparing the "left" and "right" halves of the detector.
AFM is particularly suited for biological applications, because the samples can be imaged in physiological conditions. There is no need for staining or coating, and no requirement that the sample should conduct electrons. Therefore high resolution imaging is possible in physiological buffer or medium, and over a range of temperatures. Living cells can be imaged, as well as single molecules such as proteins or DNA. The force contrast gives 3-dimensional topography information, as well as the possibility to access other information such as the mechanical properties or adhesion.  

Easy introduction to AFM
Easy introduction to SNOM
Easy introduction to Cantilevers

Scanning Probe Microscopy - SPM
Atomic Force Microscopy - AFM
Imaging modes - introduction
Imaging modes - practicalities
Imaging modes - applications
Force spectroscopy - introduction
Force spectroscopy - applications

Sample preparation