The Tip Assisted Optics Module - TAO™

The JPK Instruments TAO™ Module for the NanoWizard® is the perfect solution for advanced experiments combining AFM and optical spectroscopy. It can be used as a flexible basis for tip assisted techniques like SERS and scatter type SNOM or single molecule manipulation coupled with confocal fluorescence imaging or spectroscopy.

The simultaneous availability of all optical microscopy features together with a high performance 6 degrees of freedom nano-positioning system gives the operator maximum flexibility for customized experiments.

• Proven NanoWizard® technology
• Ultimate platform for SERS/TERS, scatter type SNOM, single molecule imaging/spectroscopy experiments
• NanoOptical studies such as quenching, field enhancement or bleaching
• Integrated sample scanning confocal imaging
• Integrates with conventional and advanced optical imaging (DIC, Phase contrast, CLSM, TIRF, FRET ...)
• Ultimate flexibility through simultaneous control of up to 6 scan axes with <nm closed loop precision (linearized with capacitive sensors):
  
  • AFM tip scanner: 100 x 100 x 15µm³
  • Sample scanner: 100 x 100 x 10µm³ or 100 x 100µm²
• Works in native environments: real in-situ measurements in fluids
• Flexible software system solution for experimental freedom and remote operation