The Tip Assisted Optics Module - TAO™

The JPK Instruments TAO™  Module for the NanoWizard ® is the perfect solution for advanced experiments combining AFM and optical spectroscopy. It can be used as a flexible basis for tip assisted techniques like SERS and scatter type SNOM or single molecule manipulation coupled with confocal fluorescence imaging or spectroscopy.

The simultaneous availability of all optical microscopy features together with a high performance 5 degrees of freedom nano-positioning system gives the operator maximum flexibility for customized experiments.

Key features

	Proven NanoWizard ® technology
	Ultimate platform for SERS, Scatter type SNOM, single molecule imaging/spectroscopy experiments
	Integrated sample scanning confocal imaging
	Integrates with conventional and advanced optical imaging (DIC, Phase contrast, CLSM, TIRF, FRET ...)
	Ultimate flexibility through simultaneous control of 5 scan axes with nm closed loop precision (linearized with capacitive sensors):
	- AFM tip scanner: 100µm x 100µm x 15µm
	- Sample scanner: 100µm x 100µm
	Works in native environments: real in-situ measurements in fluids
	Flexible software system solution for experimental freedom and remote operation
	PIFOC option allows focus tracking of vertical tip movements, also using capacitive sensors