TAO™ - Nano Sciences, Polymers & Thin Films
Sample-scanning confocal imaging of quantum dots (2)

Height image
AFM height image of quantum dots on a glass coverslip surface. Image acquired using the TAO sample scanner.
• Scan range: 7.8µm * 7.8µm.
Data courtesy of Dr. C. Heyes and Prof. G.U. Nienhaus, University of Ulm.
See the following journal article for related information:
R.J. Owen, C.D. Heyes, D. Knebel, C. Röcker, G.U. Nienhaus, "An integrated instrumental setup for the combination of atomic force microscopy with optical spectroscopy", Biopolymers 82: 410-414 (2006)


NanoWizard® 3 NanoOptics AFM system


