Atomic Force Microscopy

Specialized BioAFM solutions with true optical integration and highest resolution (afm, bioafm, bio afm, bio atomic force, atomic force microscopes, atomic force microscope, atomic force microscopy)

afm, bioafm, bio afm, bio atomic force, atomic force microscopes, atomic force microscope, atomic force microscopySpecialized BioAFM solutions with true optical integration and highest resolution

Specialized BioAFM solutions with true optical integration and highest resolution

The world's most flexible AFM

Due to JPK‘s leading tip-scanner technology and our consistent modular design philosophy, the NanoWizard® 4 is the most flexible system available on the market today. Perfect for optical integration and with the largest number of accessories and modes, it is the most versatile AFM system yet.

High resolution and fast scanning - observe sample dynamics in real-time

The NanoWizard® 4 NanoScience AFM combines closed-loop atomic resolution and fast scanning capabilities of up to  3 sec/image in a system with a large scan range of 100µm in XY. It has the lowest noise levels of the closed-loop scanner and of the deflection detection system. The powerful digital Vortis™ controller combines fast signal handling with lowest noise.

Expanded usability and experiment control

The new ExperimentControl™ simplifies setting up the instrument and remote control of complex and long-term experiments is possible via the internet by a PC, tablet or smartphone, delivering a continuous status update.

  • Fast scanning up to 3sec / image for tracking of dynamic processes
  • Outstanding high-resolution quantitative imaging made easy through QI™ quantitative imaging mode for the most challenging of AFM samples
  • Unique solutions for mechanical and electrical characterization of samples
  • Widest range of modes and accessories of any AFM
  • Fully flexible and modular design for widest range of applications