JPK Instruments Offers
Advanced Product for Combined AFM and Fluorescence
— June
24, 2004 |
With the new option for an infrared light source JPK Instruments
completes its product range for the combination of atomic force
microscopy (AFM) techniques with advanced fluorescence imaging.
Conventional AFM makes use of red laser light sources for the
detection of the forces acting on the AFM tip. Stray light of
this lightsource can impose restrictions when fluorescence observations
in the red spectral range are desired for FRET, TIRF, LSM, or
other techniques. Therefore, a new lightsource and detection path
was designed with a laser lightsource of 850nm wavelength. This
light is easily blocked off the detection path of fluorescence
microscopes by spectral filtering.
Furthermore, the new technology eliminates the interference problems
that are common for conventional AFMs. In particular, this is
beneficial for molecular unfolding or stretching, adhesion and
elastic probing, or cell adhesion measurements. Together with
the proven atomic resolution and the BioCell™ temperature
controlled fluid cell, the NanoWizard® AFM system now offers
a complete solution for AFM combined with fluorescence microscopy
for single molecule and cell investigation.
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