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Press releases
2012-01-17 | JPK reports on how graphenes are being studied using AFM to better characterize their properties at the Humboldt University in Berlin
(a) Topography image recorded in contact mode under a normal force of 25 nN. Arrow indicates an area enlarged on (b) with two resolved DNA strands running nearly parallel to each other at a distance of 10 nm, as visualized by the inserted cross section. (c) Intermittent contact mode topography image acquired a few minutes after (a) with the same tip. (d) Intermittent contact mode phase contrast image of the same area.
* Reference acknowledgment: Replication of Single Macromolecules with Graphene N . Severin*†, M. Dorn†, A. Kalachev‡, and J. P. Rabe*†;†Department of Physics, Humboldt-University Berlin, Newtonstrasse 15, 12489 Berlin, Germany. ‡PlasmaChem GmbH, Rudower Chaussee 29, 12489 Berlin, Germany: Nano Lett., 2011, 11 (6), pp 2436–2439; Publication Date (Web): May 16, 2011; Copyright © 2011 American Chemical Society
