Latest News

January 17, 2012

JPK reports on how graphenes are being studied using AFM to better characterize their … 

December 7, 2011

JPK launches QI™ - quantitative imaging mode for the most challenging of AFM  … 

November 8, 2011

Chancellor Merkel viewed JPKs NanoWizard® Atomic Force Microscope during her visit … 
 

Latest Product Info

QI™ mode - Quantitative Imaging

for imaging challenging samples with the NanoWizard® 3 AFM family

Welcome to JPK Instruments AG

We are a leading manufacturer of nano-analytical instruments - particularly based on atomic force microscope (AFM) and optical tweezers systems - for life sciences and soft matter applications. Take a closer look at our solutions!

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