Latest News
January 31, 2012
JPK reports on the current research activities of Dr Clemens Franz and his team at Karlsruhe Institute …
January 17, 2012
JPK reports on how graphenes are being studied using AFM to better characterize their properties at the …December 7, 2011
JPK launches QI™ - quantitative imaging mode for the most challenging of AFM samplesNovember 8, 2011
Chancellor Merkel viewed JPKs NanoWizard® Atomic Force Microscope during her visit at the Max-Delbrück-Center …October 18, 2011
JPK’s tenth annual International Symposium on SPM & Optical Tweezers for Life Sciences was a great …Next Event
February 5 - 9
ACMM 22 / APMC 10 / ICONN 2012, Perth, Australia. See the NanoWizard® AFM.
Latest Product Info
QI™ mode - Quantitative Imaging
for imaging challenging samples with the NanoWizard® 3 AFM family
Imprint
JPK Instruments AG
Bouchéstrasse 12
Haus 2, Aufgang C
12435 Berlin, Germany
Tel. +49 30 5331 12070
Fax +49 30 5331 22555
Email office@_delete.this.part_jpk.com
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DE813016413
Vorstand
Torsten Jähnke
Frank Pelzer (Vorsitzender)
Jörn Kamps
René Grünberg
Aufsichtsratsvorsitzender
Dr. Franz-Ferdinand von Falkenhausen