JPK Service Center
Latest Product Info
NanoTracker™ First Presentation
Ultimate optical tweezers and 3D particle tracking platform
NanoWizard® II - Combined AFM & Optical Microscopy
Fibroblast cell with phase contrast
AFM topography
AFM deflection
AFM and optic overlay
Optical phase contrast image of a fibroblast cell, with two AFM topography scans overlaid. Screenshot from AFM software.
Scan region of larger AFM image is 50 µm x 50 µm.
