NanoWizard® 3 NanoOptics AFM system- State-of-the-art digital controller with lowest noise levels.
- High speed 16bit AD conversion with 60 MHz for the photodetector signals
- 24bit ultra precise ADC with 2.5 MHz
Images/Measurements
Herpes Simplex Virus in buffer
Adsorbed onto silanized glass slide imaged in QI™ mode
Latest Product Info
QI™ mode - Quantitative Imaging
for imaging challenging samples with the NanoWizard® 3 AFM family
Atomic Force Microscopy
Accessories of the BioMAT™ Workstation (biomat accessories)
biomat accessoriesAccessories of the BioMAT™ Workstation
Where performance meets flexibility
Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. - JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.
Download accessories handbookVortis™ SPMControl station
Advanced Force Spectroscopy module
For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.
Electrical sample connection module
Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.
ForceWheel™
JPK‘s ForceWheel™ handheld accessory for most sensitive experiment control, e.g., for force spectroscopy.
Side-view cantilever holder
This holder is designed for use in combination with inverted optical microscopes to observe the cantilever region from the side.
TopViewOptics™ with boom stand
The optical system for non transparent samples or substrates such as HOPG, mica, ceramics, implants etc. Can be used in combination with inverted microscopes.
Vortis™ Advanced SPMControl station
- State-of-the-art digital controller with lowest noise levels.
- 4 high speed 16bit ADC channels with 60 MHz
- 12 ADCs with 18bit with 800 kHz
ExperimentPlanner™ software module
For comprehensive planning of an experiment with all of the external parameters.
DirectOverlay™ software module
Perfect integration of optical and AFM data – JPK‘s proprietary and patented solution for perfect overlay of optical and AFM information.
See also the product page for more information.
See also the product page for more information.
CoverslipHolder with electr. sample conn.
The CoverslipHolder with electrical sample connection is designed for electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics.
KPM and SCM module
Kelvin Probe (KPM) and Scanning Capacitance (SCM) Microscopy module. Option for nanoscale mapping of surface potential distribution.
CAFM module - enclosed volume
For experiments in inert atmosphere; for conductivity and I/V measurements on the nanoscale under controlled environmental conditions.
High Voltage Sample Bias Amplifier
Can be used for biasing a sample, e.g., in electro-optical experiments or in Piezo-Response Force Microscopy (PFM).
Cantilever holders
- Standard holder for all-round applications with a large optical field of view
- Supercut version for use in air or liquids with removable cantilever spring for maximum cleaning results.
Cant. holders for electr. & magnet. Exp.
- Cantilever holder with electrical tip connection
- Magnetic field cantilever holder for magnetic actuation
TopViewOptics™ for inv. opt. microscopes
The optical system for use with inverted optical microscopes or the JPK BioMAT™.
JPK base for acoustic enclosure
Approved for high performance applications: base frame with top plate from JPK for utmost stability.
